5 results
Ni(111) Thin Layers Recrystallization Studied by SEM, EBSD and AFM
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1982-1983
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- August 2019
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Ion-Irradiated Damage in Semiconductors Visualized by Means of Low-kV Scanning Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 486-487
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- August 2019
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Conductivity Contrast in SEM Images of Hydrogenated Graphene Grown on SiC
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 31-32
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- August 2015
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Analysis of Radiation Damage in Magnesium Aluminate Spinel by Means of Cathodoluminescence
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1005-1006
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- August 2015
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Low-kV SEM Imaging of Epitaxial Graphene Grown on Various Substrates
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 18-19
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- August 2014
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